Atomic processes for the damage on bio-molecules irradiated by XFEL

Moribayashi, Kengo; Kai, Takeshi

Journal of Physics; Conference Series, 163, p.012097_1 - 012097_4, 2009/06

https://doi.org/10.1088/1742-6596/163/1/012097

The Atomic model of the Sn plasmas for the EUV sources

Sasaki, Akira; Sunahara, Atsushi*; Nishihara, Katsunobu*; Nishikawa, Takeshi*; Koike, Fumihiro*; Tanuma, Hajime*

Journal of Physics; Conference Series, 163, p.012107_1 - 012107_4, 2009/06

https://doi.org/10.1088/1742-6596/163/1/012107

no abstracts in English

High-precision measurement of the spectral width of the nickel-like molybdenum X-ray laser

Hasegawa, Noboru; Kawachi, Tetsuya; Sasaki, Akira; Yamatani, Hiroshi; Kishimoto, Maki; Ochi, Yoshihiro; Tanaka, Momoko; Nishikino, Masaharu; Kunieda, Yuichi; Nagashima, Keisuke; et al.

Journal of Physics; Conference Series, 163(1), p.012062_1 - 012062_4, 2009/06

https://doi.org/10.1088/1742-6596/163/1/012062

The precise knowledge about the wavelength and the spectral width of the lasing line is important for the applications of X-ray lasers, and especially for the spectral width, it is good benchmark of the atomic code because it depends on the electron collisional excitation and de-excitation rate coefficient. Only a few measurements of the spectral width of the laser line have been reported, because the spectral width of the X-ray laser is so narrow that the required spectral resolution is quite high. In this study, we took the nickel-like molybdenum X-ray laser as an example, and measure the spectral width by use of the high resolution spectrometer in order to compare it with a theoretical one.

Complementary spectroscopy of tin ions using ion and electron beams

Ohashi, Hayato*; Suda, Shintaro*; Tanuma, Hajime*; Fujioka, Shinsuke*; Nishimura, Hiroaki*; Nishihara, Katsunobu*; Kai, Takeshi; Sasaki, Akira; Sakaue, Hiroyuki*; Nakamura, Nobuyuki*; et al.

Journal of Physics; Conference Series, 163, p.012071_1 - 012071_4, 2009/06

https://doi.org/10.1088/1742-6596/163/1/012071

Extreme ultra-violet (EUV) emission spectra of multiply charged tin ions were measured in the wavelength range of 10-22 nm following charge exchange collisions or the electron impact excitation of tin ions. In charge exchange collisions, we observed both the resonance lines and the emission lines corresponding to the transitions between the excited states. On the other hand, we observed mainly the resonance lines in the electron impact experiments. We can distinguish the resonance lines from other emission lines in the charge exchange spectrum by comparison with the emission lines in the electron impact spectrum.